Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure
- Bosi, Gianni
- Raffo, Antonio
- Avolio, Gustavo
- Schreurs, Dominique
- Humphreys, David A.
Publication date
January 2016
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
We analyze the uncertainty contribution of the Nonlinear-Embedding design technique in transposing the low-frequency data to microwave frequencies. Uncertainty analysis is performed with the NIST Microwave Uncertainty Framework and is applied to a GaAs pHEMT device
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