A New Technique for Thermal Resistance Measurement in Power Electron Devices
- F.FILICORI
- P.RINALDI
- G.VANNINI
- A.SANTARELLI
Publication date
January 2005
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
A simple technique is proposed for the thermal resistance measurement of electron devices. The new approach is based on the standard measurements which are normally carried out for the electrical characterization of power devices, without requiring special-purpose instrumentation and/or physics-based temperature-dependent electrical device models. Experimental results, which confirm the validity of the new method, are provided
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