Add to ORKGA new BIST scheme suitable for on-chip testing of non-volatile memories and based on signature analysis is presented. The signature of the whole memory, whose content can be selectively changed by the user, is dynamically self-learned by the memory and it is saved in a dedicated memory location. Such a signature can be externally compared with the expected one in order to check for the programming operation, or it can be used for self-test when data retention must be checke
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking...
Built-in Self-Test (BIST) techniques are used to form an effective and practical approach for VLSI c...
International audienceRe-using embedded resources for implementing built-in self test mechanisms all...
A new BIST scheme for on-chip testing of non-volatile memories and based on signature analysis is ...
The design and architecture of a reconfigurable memory BIST unit is presented. The proposed memory B...
Chip functionality testing can greatly benefit from a Built In Self-Test (BIST). The Self-Test Using...
The authors analyse off-chip and on-chip signature checking schemes suitable for boundary scan (BS) ...
[[abstract]]© 2001 Institute of Electrical and Electronics Engineers -We present a processor-program...
Abstract—As there are increasing functionalities in modern system-on-chip (SOC) design, the amount o...
[[abstract]]In the present invention a built in self test (BIST) for an embedded memory is described...
Abstract—Memory is increasingly important because of the high density of current memory chips. W...
With the advent of deep-submicron VLSI technology, core-based system-on-chip (SOC) design is attract...
The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofwa...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
Testing VLSI circuits is a complex task that requires enormous amounts of resources. To decrease tes...
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking...
Built-in Self-Test (BIST) techniques are used to form an effective and practical approach for VLSI c...
International audienceRe-using embedded resources for implementing built-in self test mechanisms all...
A new BIST scheme for on-chip testing of non-volatile memories and based on signature analysis is ...
The design and architecture of a reconfigurable memory BIST unit is presented. The proposed memory B...
Chip functionality testing can greatly benefit from a Built In Self-Test (BIST). The Self-Test Using...
The authors analyse off-chip and on-chip signature checking schemes suitable for boundary scan (BS) ...
[[abstract]]© 2001 Institute of Electrical and Electronics Engineers -We present a processor-program...
Abstract—As there are increasing functionalities in modern system-on-chip (SOC) design, the amount o...
[[abstract]]In the present invention a built in self test (BIST) for an embedded memory is described...
Abstract—Memory is increasingly important because of the high density of current memory chips. W...
With the advent of deep-submicron VLSI technology, core-based system-on-chip (SOC) design is attract...
The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofwa...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
Testing VLSI circuits is a complex task that requires enormous amounts of resources. To decrease tes...
Memory built-in self-test (BIST) is a widely used technique to allow the self-test and self-checking...
Built-in Self-Test (BIST) techniques are used to form an effective and practical approach for VLSI c...
International audienceRe-using embedded resources for implementing built-in self test mechanisms all...