In the field of pattern recognition, the concept of Multiple Classifier Systems (MCSs) was proposed as a method for the development of high performance classification systems. At present, the common “operation” mechanism of MCSs is the “combination” of classifiers outputs. Recently, some researchers pointed out the potentialities of “dynamic classifier selection” (DCS) as a new operation mechanism. In this paper, a DCS algorithm based on the MCS behaviour is presented. The proposed method is aimed to exploit the behaviour of the MCS in order to select, for each test pattern, the classifier that is more likely to provide the correct classification. Reported results on the classification of different data sets show that dynamic classifier sel...
In the field of pattern recognition, multiple classifier systems based on the combination of outputs...
While it is known that multiple classifier systems can be effective also in multi-label problems, on...
This paper presents two methods for calculating competence of a classifier in the feature space. The...
In the field of pattern recognition, the concept of multiple classifier systems (MCS) was proposed a...
In the field of pattern recognition, multiple classifier systems based on the combination of outputs...
At present, the usual operation mechanism of multiple classifier systems is the combination of class...
Problem of pattern recognition is accompanying our whole life, therefore methods of automatic patter...
Dynamic classifier selection (DCS) plays a strategic role in the field of multiple classifier system...
Multiple classifier systems (MCSs) based on the combination of outputs of a set of different classif...
The pace of generating data in all areas is extremely high. This pace has been mounting the pressure...
At present, the usual operation mechanism of multiple classifier systems is the combination of class...
Recently, the concept of Multiple Classifier Systems was proposed as a new approach to the developme...
The simultaneous use of multiple classifiers has been shown to provide performance improvement in cl...
In the paper measures of classifier competence and diversity using a probabilistic model are propose...
In this paper, a new probabilistic model using measures of classifier competence and diversity is pr...
In the field of pattern recognition, multiple classifier systems based on the combination of outputs...
While it is known that multiple classifier systems can be effective also in multi-label problems, on...
This paper presents two methods for calculating competence of a classifier in the feature space. The...
In the field of pattern recognition, the concept of multiple classifier systems (MCS) was proposed a...
In the field of pattern recognition, multiple classifier systems based on the combination of outputs...
At present, the usual operation mechanism of multiple classifier systems is the combination of class...
Problem of pattern recognition is accompanying our whole life, therefore methods of automatic patter...
Dynamic classifier selection (DCS) plays a strategic role in the field of multiple classifier system...
Multiple classifier systems (MCSs) based on the combination of outputs of a set of different classif...
The pace of generating data in all areas is extremely high. This pace has been mounting the pressure...
At present, the usual operation mechanism of multiple classifier systems is the combination of class...
Recently, the concept of Multiple Classifier Systems was proposed as a new approach to the developme...
The simultaneous use of multiple classifiers has been shown to provide performance improvement in cl...
In the paper measures of classifier competence and diversity using a probabilistic model are propose...
In this paper, a new probabilistic model using measures of classifier competence and diversity is pr...
In the field of pattern recognition, multiple classifier systems based on the combination of outputs...
While it is known that multiple classifier systems can be effective also in multi-label problems, on...
This paper presents two methods for calculating competence of a classifier in the feature space. The...