One of the main challenge of satellite manufacturers is its fully safety and complete operational functioning and, once a satellite is orbiting, the thermal management of its electronical equipment is one of the most significant issue. In order to verify if all the devices maintain high performances also under the thermal stresses point of view, it is always necessary to perform a detailed thermal analysis of the electronic equipment which of course requires that its thermal properties must be correctly identified. Usually thermal designers consider worst case conditions in order to simplify the numerical simulations and to ensure functionality and safety but when challenging operative condition, high power consumption are required, or more...
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microp...
Thermal management is critical to the performance, lifetime, and reliability of electronic devices. ...
Thermal limitations are an increasing issue in micro-electronic performance and reliability. This st...
Several factors such as copper density, number of copper layers, surface properties, connectors, etc...
Several factors such as copper density, number of copper layers, surface properties, connectors, etc...
The following document describes an example mission, which originated from a real life concept of an...
The following document describes an example mission, which originated from a real life concept of an...
When designing satellites, one of the major issues aside for designing its primary subsystems is to ...
The following document describes an example mission, which originated from a real life concept of an...
La thèse s’intéresse au comportement thermomécanique des circuits imprimés pour des applications spa...
The advantages and possible pitfalls of using a generalized method of measuring and, based on these ...
Recent advances in thermal imaging technology have spawned a number of new thermal NDE techniques th...
The objectives of this project are to understand the phenomena involved in the thermal behavior of e...
Heat conduction analysis is performed on a model system to survey the effects of geometric and therm...
Recent advances in thermal imaging technology have spawned a number of new thermal NDE techniques th...
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microp...
Thermal management is critical to the performance, lifetime, and reliability of electronic devices. ...
Thermal limitations are an increasing issue in micro-electronic performance and reliability. This st...
Several factors such as copper density, number of copper layers, surface properties, connectors, etc...
Several factors such as copper density, number of copper layers, surface properties, connectors, etc...
The following document describes an example mission, which originated from a real life concept of an...
The following document describes an example mission, which originated from a real life concept of an...
When designing satellites, one of the major issues aside for designing its primary subsystems is to ...
The following document describes an example mission, which originated from a real life concept of an...
La thèse s’intéresse au comportement thermomécanique des circuits imprimés pour des applications spa...
The advantages and possible pitfalls of using a generalized method of measuring and, based on these ...
Recent advances in thermal imaging technology have spawned a number of new thermal NDE techniques th...
The objectives of this project are to understand the phenomena involved in the thermal behavior of e...
Heat conduction analysis is performed on a model system to survey the effects of geometric and therm...
Recent advances in thermal imaging technology have spawned a number of new thermal NDE techniques th...
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microp...
Thermal management is critical to the performance, lifetime, and reliability of electronic devices. ...
Thermal limitations are an increasing issue in micro-electronic performance and reliability. This st...