The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of bot...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Processors' design complexity increases with transistors' growing density. At the same time, market ...
The use of microprocessor-based systems is gaining importance in application domains where safety is...
Hybrid error-detection techniques combine software techniques with an external hardware module that ...
This paper presents a detailed analysis of the efficiency of software-based techniques to mitigate S...
This article proposes a software error mitigation approach that uses the single instruction multiple...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
The importance of fault tolerance at the processor archi-tecture level has been made increasingly im...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
This paper presents a solution for error detection in ARM microprocessors based on the use of the tr...
This article presents a software protection technique against radiation-induced faults which is base...
ARM processors are leaders in embedded systems, delivering high-performance computing, power efficie...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Processors' design complexity increases with transistors' growing density. At the same time, market ...
The use of microprocessor-based systems is gaining importance in application domains where safety is...
Hybrid error-detection techniques combine software techniques with an external hardware module that ...
This paper presents a detailed analysis of the efficiency of software-based techniques to mitigate S...
This article proposes a software error mitigation approach that uses the single instruction multiple...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
Integrity assurance of configuration data has a significant impact on microcontroller-based systems ...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
The importance of fault tolerance at the processor archi-tecture level has been made increasingly im...
Software-based fault tolerance techniques are a low-cost way to protect processors against soft erro...
This paper presents a solution for error detection in ARM microprocessors based on the use of the tr...
This article presents a software protection technique against radiation-induced faults which is base...
ARM processors are leaders in embedded systems, delivering high-performance computing, power efficie...
Shrinking microprocessor feature size and growing transistor density may increase the soft-error rat...
The improvement of dependability in computing systems requires the evaluation of fault tolerance mec...
Processors' design complexity increases with transistors' growing density. At the same time, market ...