Fast Calculation of Dielectric Substrate Losses in Microwave Applications by the FD2TD Method Using a New Formalism
- C., Buccella
- V., DE SANTIS
- M., Feliziani
- Maradei, Francescaromana
Publication date
January 2010
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
The paper deals with the electromagnetic characterization of a dielectric substrate by a numerical analysis. The electromagnetic analysis is performed by a frequency-dependent finite difference time domain (FD2TD) method with a new formulation. A multi-pole Debye dispersive relation is used to model frequency-dependent properties of dispersive dielectrics. The proposed method is suitable to predict efficiently substrate dielectric losses in microwave and RF applications
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