In this paper, we present a new technique for assessing the validity of the reference impedance in multiline thru-reflect-line (mTRL) calibration. When performing an mTRL calibration, it is assumed that all transmission line standards exhibit the same characteristic impedance. As a result, the reference impedance after calibration is set to the characteristic impedance of the transmission line standards used in the calibration. However, because of imperfections, these assumptions are prone to errors. The purpose of this paper is to assess the validity of the reference impedance after an mTRL calibration. The method we propose uses the reflection coefficient of an impedance transition segment as a verification metric. The verification is ach...
We present a multiline Thru-Reflect-Line (TRL) calibration standard for Planar Goubau Line (PGL) whi...
Microwave probes in on-wafer measurements contribute to a number of parasitic effects deteriorating ...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...
In this paper, we analyze the impact of characteristic impedance variations among standards on the a...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
The multimode thru-reflect-line (TRL) calibration technique is widely applied to characterizing diff...
* US government publication, not subject to copyright. Abstract — We examine the performance of two ...
A novel method that allows to compare different calibration techniques has been developed. It is bas...
Part 1 for this thesis is on the error assessment of a time-domain (t-TRL) calibration technique. Ap...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
In this paper, we propose a method based on 3-D electromagnetic simulations, for the characteristic ...
Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compare...
On-wafer probing with ground-signal-ground (GSG) probes contributes a variety of side effects, which...
An improved line-reflect-reflect-match calibration with an enhanced load model is proposed. Differen...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
We present a multiline Thru-Reflect-Line (TRL) calibration standard for Planar Goubau Line (PGL) whi...
Microwave probes in on-wafer measurements contribute to a number of parasitic effects deteriorating ...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...
In this paper, we analyze the impact of characteristic impedance variations among standards on the a...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
The multimode thru-reflect-line (TRL) calibration technique is widely applied to characterizing diff...
* US government publication, not subject to copyright. Abstract — We examine the performance of two ...
A novel method that allows to compare different calibration techniques has been developed. It is bas...
Part 1 for this thesis is on the error assessment of a time-domain (t-TRL) calibration technique. Ap...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
In this paper, we propose a method based on 3-D electromagnetic simulations, for the characteristic ...
Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compare...
On-wafer probing with ground-signal-ground (GSG) probes contributes a variety of side effects, which...
An improved line-reflect-reflect-match calibration with an enhanced load model is proposed. Differen...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
We present a multiline Thru-Reflect-Line (TRL) calibration standard for Planar Goubau Line (PGL) whi...
Microwave probes in on-wafer measurements contribute to a number of parasitic effects deteriorating ...
The technological downscaling has improved the figures of merit of silicon-based technology, enablin...