The statistical character of electron beams used in current technologies, as described by a stream of particles, is random in nature. Using coincidence measurements of femtosecond pulsed electron pairs, we report the observation of sub-Poissonian electron statistics that are nonrandom due to two-electron Coulomb interactions, and that exhibit an antibunching signal of 1 part in 4. This advancement is a fundamental step toward observing a strongly quantum degenerate electron beam needed for many applications, and in particular electron correlation spectroscopy
A non-perturbative treatment is developed for the dephasing produced by the shot noise of a one-dime...
With the development of ultrafast electron and X-ray sources it is becoming possible to study struct...
Free electron beams such as those employed in electron microscopes have evolved into powerful tools ...
We observe Coulomb-correlated electron pair and triple states generated by femtosecond photoemission...
We present a quantum calculation of the electron degeneracy for electron sources. We explore quantum...
The non-linear response of a beam splitter to the coincident arrival of interacting particles enable...
Pulsed electron beams allow for the direct atomic-scale observation of structures with femtosecond t...
Recently, interest in anti-bunched electron beams has surged because of their potential in free elec...
Tip-based photoemission electron sources offer unique properties for ultrafast imaging, diffraction,...
Precise control over interactions between ballistic electrons will enable us to exploit Coulomb inte...
Ultrafast measurement technology provides essential contributions to our understanding of the proper...
Diffraction and microscopy with ultrashort electron pulses can reveal atomic-scale motion during mat...
We report on shot noise cross spectrum measurements in a beam splitter configuration. Electrons tunn...
Electron correlation, caused by the interaction among electrons in a multielectron system, manifests...
AbstractPump–probe electron diffraction and ultrafast microscopy, based on laser excitation and prob...
A non-perturbative treatment is developed for the dephasing produced by the shot noise of a one-dime...
With the development of ultrafast electron and X-ray sources it is becoming possible to study struct...
Free electron beams such as those employed in electron microscopes have evolved into powerful tools ...
We observe Coulomb-correlated electron pair and triple states generated by femtosecond photoemission...
We present a quantum calculation of the electron degeneracy for electron sources. We explore quantum...
The non-linear response of a beam splitter to the coincident arrival of interacting particles enable...
Pulsed electron beams allow for the direct atomic-scale observation of structures with femtosecond t...
Recently, interest in anti-bunched electron beams has surged because of their potential in free elec...
Tip-based photoemission electron sources offer unique properties for ultrafast imaging, diffraction,...
Precise control over interactions between ballistic electrons will enable us to exploit Coulomb inte...
Ultrafast measurement technology provides essential contributions to our understanding of the proper...
Diffraction and microscopy with ultrashort electron pulses can reveal atomic-scale motion during mat...
We report on shot noise cross spectrum measurements in a beam splitter configuration. Electrons tunn...
Electron correlation, caused by the interaction among electrons in a multielectron system, manifests...
AbstractPump–probe electron diffraction and ultrafast microscopy, based on laser excitation and prob...
A non-perturbative treatment is developed for the dephasing produced by the shot noise of a one-dime...
With the development of ultrafast electron and X-ray sources it is becoming possible to study struct...
Free electron beams such as those employed in electron microscopes have evolved into powerful tools ...