On-detector digital electronics in high-energy physics (HEP) experiments is increasingly being implemented by means of static random access memory (SRAM)-based field programmable gate arrays (FPGAs), due to their reconfigurability, fast data processing, and transfer. Radiation-induced single-event upsets (SEUs) in the configuration hinder the correct operation, since they may alter the programmed routing paths and logic functions. In most data acquisition systems, data from clustered front-end modules are aggregated by a single board, which then transmits data to off-detector electronics for acquisition and triggering. In this work, we present a novel scrubber capable of correcting radiation-induced upsets in the configuration of SRAM-based...