In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core conducted at the ISIS ChipIR neutron irradiation facility. The test setup also included a CMOS camera sensor used for dosimetry estimation. The results provide the core memory and internal resources cross section thus giving useful information for developing ad-hoc fault tolerant techniques on sensitive parts
This paper assesses the soft error reliability of attitude estimation algorithms running on a resour...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
In the CORTEX project, methods to simulate neutron flux oscillations were enhanced and machine-learn...
In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core condu...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Embedded processors had been established as common components in modern systems. Usually, they are p...
Abstract–Graphics Processing Units specifically designed for High Performance Computing applications...
International audienceThe peripheral dose distribution is a growing concern for the improvement of n...
The present work assesses the radiation sensitivity of an affordable and performant COTS multicore p...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE)IEEE Catalog Number: CFP1...
Proceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analy...
International audienceRadiation tests with 15-MeV neutrons were performed in a COTS SRAM including a...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
This paper assesses the soft error reliability of attitude estimation algorithms running on a resour...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
In the CORTEX project, methods to simulate neutron flux oscillations were enhanced and machine-learn...
In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core condu...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Embedded processors had been established as common components in modern systems. Usually, they are p...
Abstract–Graphics Processing Units specifically designed for High Performance Computing applications...
International audienceThe peripheral dose distribution is a growing concern for the improvement of n...
The present work assesses the radiation sensitivity of an affordable and performant COTS multicore p...
A portable high speed digital electronic DRAM radiation detection system was designed and constructe...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE)IEEE Catalog Number: CFP1...
Proceeding of: 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analy...
International audienceRadiation tests with 15-MeV neutrons were performed in a COTS SRAM including a...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
This paper assesses the soft error reliability of attitude estimation algorithms running on a resour...
As the dimensions and operating voltage of semiconductor devices are reduced, neutron-induced soft e...
In the CORTEX project, methods to simulate neutron flux oscillations were enhanced and machine-learn...