Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes

This article investigates the possibility to develop time-domain immunity tests using electric near-field probes, for flexible customization of broadband input waveforms injected into specific pins of PCBs. For this purpose, a test design methodology is proposed, which is based on circuit modeling of the injection mechanism on the one hand, and on pulse design and equalization on the other hand. Two circuit models are developed. The former employs measurement/simulation data along with port-reduction techniques to model noise injection through near-field probes by means of internal induced sources. Conversely, the latter model only includes passive components and is derived starting from physical observation of the involved phenomena. Both models are compatible with circuit solvers and can be easily adapted for different traces under test. Since pulse-like noise is usually broadband, suitable stress waveforms are utilized to obtain different noise spectra. Also, in order to precisely control the shape of the waveform reaching the targeted pin, an equalization procedure is employed. These models and techniques can be easily applied to amplification systems originally designed for frequency-domain tests, thus providing a comprehensive solution for the design of broadband immunity tests in the time domain. The feasibility and accuracy of the proposed methodology are proved by full-wave simulations and measurements