Add to ORKGThis technical report describes the uncertainty assessment on scattering parameter measurements obtained from different vector network analyzer calibration algorithms in WR-10 millimeter waveguide (from 75 to 110 GHz). The calibration algorithms considered for this exercise are Thru-Reflect-Line and Quick Short-Open-Load-Thru. The latter turned out to be a suitable traceable calibration method for waveguide measurements
Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to charac...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
In this paper, a thorough evaluation of calibration residual uncertainty of on-wafer load-pull syst...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL c...
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL c...
In this paper, we describe a new measurement capability which provides fully calibrated, traceable s...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to charac...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
In this paper, a thorough evaluation of calibration residual uncertainty of on-wafer load-pull syst...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper describes the scattering parameters magnitude measurement and uncertainty comparison usi...
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL c...
This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL c...
In this paper, we describe a new measurement capability which provides fully calibrated, traceable s...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
Abstract. Radio-frequency (RF) scattering parameters (S-parameters) play an important role to charac...
This paper presents a strategy for achieving metrological traceability using vector network analyzer...
In this paper, a thorough evaluation of calibration residual uncertainty of on-wafer load-pull syst...