The combination of a non coated silicon photodiode with electron repelling meshes makes a versatile detector for total fluorescence yield and electron yield techniques highly suitable for x ray absorption spectroscopy. In particular, a copper mesh with a bias voltage allows to suppress or transmit the electron yield signal. The performance of this detection scheme has been characterized by near edge x ray absorption fine structure studies of thermal oxidized silicon and sapphire. The results show that the new detector probes both electron yield and for a bias voltage exceeding the maximum photon energy the total fluorescence yiel
We report on the performances of energy resolved detectors and electronics developed for X-ray absor...
A tremendous development in the field of imaging radiation detectors has taken place in the last dec...
Third and fourth generation light sources have revolutionized the research in many scientific and te...
Abstract: Low-energy X-ray fluorescence (LEXRF) is an essential tool for bio-related research of org...
International audienceInfluence of an extra electron yield induced by the fluorescence process has b...
We report a method to determine the quantum detection efficiency and the absorbing layers on a front...
The electron yield at atmospheric pressure for X ray absorption spectroscopy is a new technique able...
On montre qu'un réseau de quatre photodiodes en silicium utilisées en mode photovoltaïque présente d...
A total-electron-yield technique is described in which near-surface extended x-ray-absorption fine-s...
High resolution Si L-edge and K-edge X-ray absorption near edge structure (XANES) spectra for SiO2 o...
Imaging spectrometers based on a fully depleted silicon substrate are sensitive over the whole devic...
The measurement of the X-ray fluorescence (XRF) spectrum (spectroscopy) represents a very versatile ...
Surface sensitivity in the soft X-ray absorption spectroscopy by the fluorescent X-ray yield detecti...
We report on the performances of energy resolved detectors and electronics developed for X-ray absor...
A tremendous development in the field of imaging radiation detectors has taken place in the last dec...
Third and fourth generation light sources have revolutionized the research in many scientific and te...
Abstract: Low-energy X-ray fluorescence (LEXRF) is an essential tool for bio-related research of org...
International audienceInfluence of an extra electron yield induced by the fluorescence process has b...
We report a method to determine the quantum detection efficiency and the absorbing layers on a front...
The electron yield at atmospheric pressure for X ray absorption spectroscopy is a new technique able...
On montre qu'un réseau de quatre photodiodes en silicium utilisées en mode photovoltaïque présente d...
A total-electron-yield technique is described in which near-surface extended x-ray-absorption fine-s...
High resolution Si L-edge and K-edge X-ray absorption near edge structure (XANES) spectra for SiO2 o...
Imaging spectrometers based on a fully depleted silicon substrate are sensitive over the whole devic...
The measurement of the X-ray fluorescence (XRF) spectrum (spectroscopy) represents a very versatile ...
Surface sensitivity in the soft X-ray absorption spectroscopy by the fluorescent X-ray yield detecti...
We report on the performances of energy resolved detectors and electronics developed for X-ray absor...
A tremendous development in the field of imaging radiation detectors has taken place in the last dec...
Third and fourth generation light sources have revolutionized the research in many scientific and te...