The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnetic properties of magnetron sputtered Py/Ti multilayers was studied. The thickness of the Py layers was varied in the interval of 8 to 30 Å. X-ray reflectivity scans evidence the existence of a well-defined layered structure in all the samples considered, but also the presence of a complex intermixed interface. The shape of both the temperature dependence of magnetization and the hysteresis loops of the multilayered structures depends strongly on Py thickness. Magnetic and reflectivity measurements were comparatively analyzed in order to better understand the structure of the samples, and specifically, their interfaces. In particular, th...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
Lucinski T, Stobiecki F, Elefant D, et al. The influence of sublayer thickness on GMR and magnetisat...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magne...
The microstructure, anisotropic magnetoresistance, magnetic properties and magnetic domain structure...
The microstructure, anisotropic magnetoresistance, magnetic properties and magnetic domain structure...
Using polarized neutron reflectivity (PNR) measurements together with associated simulation, magneti...
Thermal stability of equidistant nanometer (nm) range Ti/Ni multilayer (ML) structures have been stu...
We report on the influence of different sputtering conditions on the structural and magnetic propert...
The magnetization and anisotropy of Ni81Fe19/W90Ti10 multilayers prepared by DC sputtering are prese...
Structural and magnetic properties of Ni81Fe19/Zr multilayers, prepared by DC magnetron sputtering, ...
[[abstract]]Using polarized neutron reflectivity (PNR) measurements together with associated simulat...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
Lucinski T, Stobiecki F, Elefant D, et al. The influence of sublayer thickness on GMR and magnetisat...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magnet...
The influence of the thickness of the Ni0.8Fe0.2 (Permalloy, Py) layers on the structural and magne...
The microstructure, anisotropic magnetoresistance, magnetic properties and magnetic domain structure...
The microstructure, anisotropic magnetoresistance, magnetic properties and magnetic domain structure...
Using polarized neutron reflectivity (PNR) measurements together with associated simulation, magneti...
Thermal stability of equidistant nanometer (nm) range Ti/Ni multilayer (ML) structures have been stu...
We report on the influence of different sputtering conditions on the structural and magnetic propert...
The magnetization and anisotropy of Ni81Fe19/W90Ti10 multilayers prepared by DC sputtering are prese...
Structural and magnetic properties of Ni81Fe19/Zr multilayers, prepared by DC magnetron sputtering, ...
[[abstract]]Using polarized neutron reflectivity (PNR) measurements together with associated simulat...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
The crucial point in the characterization of magnetic interfaces is the knowledge of the morphology ...
Lucinski T, Stobiecki F, Elefant D, et al. The influence of sublayer thickness on GMR and magnetisat...