The dynamic characterization of a set of gold micro beams by electrostatic excitation in presence of residual stress gradient has been studied experimentally. A method to determine the micro-cantilever residual stress gradient by measuring the deflection and curvature and then identifying the residual stress model by means of frequency shift behaviour is presented. A comparison with different numerical FEM models and experimental results has been carried out, introducing in the model the residual stress of the structures, responsible for an initial upward curvature. Dynamic spectrum data are measured via optical interferometry and experimental frequency shift curves are obtained by increasing the dc voltage applied to the specimens. A good ...
MEMS resonators are designed for a fixed resonant frequency. Therefore, any shift in the resonant ...
This paper investigates the features of different techniques to model the dynamic behaviour of micro...
Residual stresses play an important role in deciding the performance and reliability of MEMS devices...
The dynamic characterization of a set of gold micro beams by electrostatic excitation in presence of...
A method of determining the micro-cantilever residual stress gradients by studying its deflection an...
This paper presents an analytical method to calculate residual stress and Young’s modulus in clampe...
The residual stress in a polysilicon beam varies throughout its thickness and will cause a freestand...
Electrostatically actuated radio frequency microelectromechanical systems (RF-MEMS) generally consis...
Out-of-plane bending tests are here used to experimentally validate some numerical models of microbe...
This paper investigates the influence of residual stress on the characteristics of electrostatic act...
The out-of-plane deformation and the pull-in voltage of electrostatically actuated cantilevers with ...
In this paper an experimental validation of numerical approaches aimed to predict the coupled behavi...
In this paper, a new approach is presented for local residual stress measurement in MEMS structures....
Freestanding MEMS structures made of two long connected beams from different materials are fabricate...
[[abstract]]A technique that provides a first approximation to the mean, sigma(0), and gradient, sig...
MEMS resonators are designed for a fixed resonant frequency. Therefore, any shift in the resonant ...
This paper investigates the features of different techniques to model the dynamic behaviour of micro...
Residual stresses play an important role in deciding the performance and reliability of MEMS devices...
The dynamic characterization of a set of gold micro beams by electrostatic excitation in presence of...
A method of determining the micro-cantilever residual stress gradients by studying its deflection an...
This paper presents an analytical method to calculate residual stress and Young’s modulus in clampe...
The residual stress in a polysilicon beam varies throughout its thickness and will cause a freestand...
Electrostatically actuated radio frequency microelectromechanical systems (RF-MEMS) generally consis...
Out-of-plane bending tests are here used to experimentally validate some numerical models of microbe...
This paper investigates the influence of residual stress on the characteristics of electrostatic act...
The out-of-plane deformation and the pull-in voltage of electrostatically actuated cantilevers with ...
In this paper an experimental validation of numerical approaches aimed to predict the coupled behavi...
In this paper, a new approach is presented for local residual stress measurement in MEMS structures....
Freestanding MEMS structures made of two long connected beams from different materials are fabricate...
[[abstract]]A technique that provides a first approximation to the mean, sigma(0), and gradient, sig...
MEMS resonators are designed for a fixed resonant frequency. Therefore, any shift in the resonant ...
This paper investigates the features of different techniques to model the dynamic behaviour of micro...
Residual stresses play an important role in deciding the performance and reliability of MEMS devices...