A summary of the research performed on the optical characterization of Sc and of several lanthanides from the visible to the soft x-rays is presented. The low absorption of these materials mainly below the O2,3 edge (L 2,3 edge for Sc) turns them promising materials for the realization of multilayer mirrors in a spectral range in which most materials in nature absorb strongly. Thin-film samples with several thicknesses of the target material were deposited by evaporation over thin-film substrates in UHV, and their transmittance was measured in situ. A wide spectral range of direct characterization, along with extrapolations to longer and shorter wavelengths either using literature data (when available) or model predictions, enabled the deve...
The optical constants of Eu films were obtained in the 8.3-1400 eV range from transmittance measurem...
The optical constants of Ce films were obtained in the 6-1200 eV range from transmittance measuremen...
Polycrystalline, dielectric thin films are grown by the ultrahigh vacuum technique of molecular-beam...
A summary of the research performed on the optical characterization of Sc and of several lanthanides...
Scandium containing multilayers have been produced with very high reflectivity in the soft x-ray spe...
The optical constants n and k of lutetium (Lu) films were obtained in the 3-1800 eV range from trans...
The response of a given material to an incident electromagnetic wave is described by the energy depe...
The determination of fundamental optical parameters is essential for the development of new optical ...
The research on rare earths conducted by the current team addresses in this proceeding the transmitt...
The transmittance of thin films of Yb deposited by evaporation in ultra high vacuum (UHV) conditions...
A new investigation of the optical properties of scandium is presented. Near-normal-incidence reflec...
Current technology has made possible the fabrication of multilayered optical elements for soft x-ray...
The extinction coefficient of Pr, Eu and Tm thin films prepared by evaporation in ultra high vacuum ...
A method for obtaining the optical constants by employing the correlation between the characteristic...
Strontium (Sr) is a material with low-absorption bands in the extreme ultraviolet (EUV), which makes...
The optical constants of Eu films were obtained in the 8.3-1400 eV range from transmittance measurem...
The optical constants of Ce films were obtained in the 6-1200 eV range from transmittance measuremen...
Polycrystalline, dielectric thin films are grown by the ultrahigh vacuum technique of molecular-beam...
A summary of the research performed on the optical characterization of Sc and of several lanthanides...
Scandium containing multilayers have been produced with very high reflectivity in the soft x-ray spe...
The optical constants n and k of lutetium (Lu) films were obtained in the 3-1800 eV range from trans...
The response of a given material to an incident electromagnetic wave is described by the energy depe...
The determination of fundamental optical parameters is essential for the development of new optical ...
The research on rare earths conducted by the current team addresses in this proceeding the transmitt...
The transmittance of thin films of Yb deposited by evaporation in ultra high vacuum (UHV) conditions...
A new investigation of the optical properties of scandium is presented. Near-normal-incidence reflec...
Current technology has made possible the fabrication of multilayered optical elements for soft x-ray...
The extinction coefficient of Pr, Eu and Tm thin films prepared by evaporation in ultra high vacuum ...
A method for obtaining the optical constants by employing the correlation between the characteristic...
Strontium (Sr) is a material with low-absorption bands in the extreme ultraviolet (EUV), which makes...
The optical constants of Eu films were obtained in the 8.3-1400 eV range from transmittance measurem...
The optical constants of Ce films were obtained in the 6-1200 eV range from transmittance measuremen...
Polycrystalline, dielectric thin films are grown by the ultrahigh vacuum technique of molecular-beam...