Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

TRAUM, Christian
LOREN-INACIO, Patricia
FELIX, Corinne
SEGONDS, Patricia
PENA, Alexandra
DEBRAY, Jérome
BOULANGER, Benoit
PETIT, Yannick
RYTZ, D.
MONTEMEZZANI, G.
GOLDNER, P.
FERRIER, Alban

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Publication date

January 2014

DOI

10.1364/OME.4.000057

Publisher

The Optical Society

Journal

Optical Materials Express

Abstract

We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO

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Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

Abstract

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Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength

Abstract

Extracted data

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