The Fe/NiO interface studied by polarization dependent X \u2013 ray absorption spectroscopy
- S., Colonna
- P., Luches
- Valeri, Sergio
- F., Boscherini
Publication date
January 2006
DOI Publisher
Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598 ISSN
0168-583X Citation count (estimate)
6Abstract
In order to provide a structural basis for the modelling of the electronic and magnetic properties of the Fe/NiO(001) interface we haveperformed polarization dependent Fe K-edge X-ray absorption measurements. A multi-shell fit of the data is presented and discussed.We find that a 2 ML Fe film exhibits a complete tetragonal distortion of the unit cell and demonstrate the formation of a planar FeOlayer with expanded Fe\u2013O distances perpendicular to the growth plane. We discuss a model for the interface with the FeO layer at theoxide\u2013metal interface. At 10 ML thickness the tetragonal strain of the Fe film is partially released._ 2005 Elsevier B.V. All rights reserved
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