An analysis of the possible failure modes of TTL-LS was carried out, with particular emphasis on long term stability of Schottky diodes, all realized by PtSi-Ti/W-Al metallization system
Solid State Lighting (SSL) technologies and products are gradually pervading into our daily life. An...
This project was done in cooperation with the TE-EPC-LPC section at CERN. They were experiencing fai...
Solid-State Lighting (SSL) applications are slowly but gradually pervading into our daily life. An S...
An analysis of the possible failure modes of TTL-LS was carried out, with particular emphasis on lon...
The study describes the consequences of interdiffusione effects, compound formation and Schottky b...
Metallurgical and electrical failure mechanisms of the PtSi- Ti/W-Al metal system were investigated ...
Failure modes of bipolar Schottky logic devices due to metallurgical degradation of PtSi/Ti-W/Al con...
The stability of metal layers on semiconductors is a key issue for the device electrical performance...
An analysis of the cause of failure has been carried out on a batch of circuits rejected in TTL (wi...
Novel method for optimising the fabrication of Schottky diodes with an evaluation on short term heat...
This report intends to summarize some of the degradation modes and capabilities of typical LEDs and ...
Pulsed stress reliability investigations have been carried out for Schottky diodes. A thermal charac...
The Trigger Synchronisation and Distribution System (TSDS) is one of the core components of the LHC ...
Electrical reliability issues of two organic aromatic low-K materials (K = 2.6- 2.8) were investigat...
Time-Dependent Dielectric Breakdown (TDDB) in the Backend-of-Line (BEoL) stack has become one of the...
Solid State Lighting (SSL) technologies and products are gradually pervading into our daily life. An...
This project was done in cooperation with the TE-EPC-LPC section at CERN. They were experiencing fai...
Solid-State Lighting (SSL) applications are slowly but gradually pervading into our daily life. An S...
An analysis of the possible failure modes of TTL-LS was carried out, with particular emphasis on lon...
The study describes the consequences of interdiffusione effects, compound formation and Schottky b...
Metallurgical and electrical failure mechanisms of the PtSi- Ti/W-Al metal system were investigated ...
Failure modes of bipolar Schottky logic devices due to metallurgical degradation of PtSi/Ti-W/Al con...
The stability of metal layers on semiconductors is a key issue for the device electrical performance...
An analysis of the cause of failure has been carried out on a batch of circuits rejected in TTL (wi...
Novel method for optimising the fabrication of Schottky diodes with an evaluation on short term heat...
This report intends to summarize some of the degradation modes and capabilities of typical LEDs and ...
Pulsed stress reliability investigations have been carried out for Schottky diodes. A thermal charac...
The Trigger Synchronisation and Distribution System (TSDS) is one of the core components of the LHC ...
Electrical reliability issues of two organic aromatic low-K materials (K = 2.6- 2.8) were investigat...
Time-Dependent Dielectric Breakdown (TDDB) in the Backend-of-Line (BEoL) stack has become one of the...
Solid State Lighting (SSL) technologies and products are gradually pervading into our daily life. An...
This project was done in cooperation with the TE-EPC-LPC section at CERN. They were experiencing fai...
Solid-State Lighting (SSL) applications are slowly but gradually pervading into our daily life. An S...