The Raman peak associated with Si-Ge vibrations in short-period Si/Ge (001) superlattices is studied both experimentally and theoretically. On the experimental side, we use a microprobe technique which allows us to investigate the longitudinal (L) and transverse (T) spectra, and find an unexpected behavior of the line shape and L-T spitting of this peak. By means of first-principles calculations, taking into account both strain and interface intermixing, we show that such behavior is consistent with the picture of an intermixed alloy layer at the interfaces, and we are able to identify the character and spatial localization of the individual atomic clusters contributing to the vibrations
Second-harmonic (SH) generation has been applied to study the interfaces of short-period (GenSim)(p)...
The phonon spectra of Si/Ge superlattices are calculated along the growth direction. Besides folded ...
We report on growth and properties of Si/SiGe strained layer superlattices. Critical thicknesses and...
The Raman peak associated with Si-Ge vibrations in short-period Si/Ge (001) superlattices is studied...
The Raman peak associated with Si-Ge vibrations in short-period Si/Ge (001) superlattices is studied...
Phonons in short-period (001)-Si(n)Ge(n) Superlattices (SL's) have been studied both theoretically, ...
We present a model calculation or phonon spectra of Si/Ge superlattices along the (001) growth direc...
Using a micro-Raman setup, in-plane Raman scattering was performed on short-period (001)-Si/Ge super...
Using a micro-Raman setup, in-plane Raman scattering was performed on short-period (001)-Si/Ge super...
We study the effect of the different lateral scale of interface roughness on the optical photon spec...
We study the effect of the different lateral scale of interface roughness on the optical photon spec...
We illustrate the usefulness of the Extended X-ray Absorption Fine Structure (EXAFS) technique to de...
The interfaces in Si0.65Ge0.35/Si superlattices grown at different temperatures (250\u2013750 \ub0C)...
We present a micro-Raman study of short-period [001] Si/Ge superlattices. The submicron spatial reso...
Raman spectroscopy and spectroscopic ellipsometry have been used to characterize Si/Si-0.78 Ge-0.22 ...
Second-harmonic (SH) generation has been applied to study the interfaces of short-period (GenSim)(p)...
The phonon spectra of Si/Ge superlattices are calculated along the growth direction. Besides folded ...
We report on growth and properties of Si/SiGe strained layer superlattices. Critical thicknesses and...
The Raman peak associated with Si-Ge vibrations in short-period Si/Ge (001) superlattices is studied...
The Raman peak associated with Si-Ge vibrations in short-period Si/Ge (001) superlattices is studied...
Phonons in short-period (001)-Si(n)Ge(n) Superlattices (SL's) have been studied both theoretically, ...
We present a model calculation or phonon spectra of Si/Ge superlattices along the (001) growth direc...
Using a micro-Raman setup, in-plane Raman scattering was performed on short-period (001)-Si/Ge super...
Using a micro-Raman setup, in-plane Raman scattering was performed on short-period (001)-Si/Ge super...
We study the effect of the different lateral scale of interface roughness on the optical photon spec...
We study the effect of the different lateral scale of interface roughness on the optical photon spec...
We illustrate the usefulness of the Extended X-ray Absorption Fine Structure (EXAFS) technique to de...
The interfaces in Si0.65Ge0.35/Si superlattices grown at different temperatures (250\u2013750 \ub0C)...
We present a micro-Raman study of short-period [001] Si/Ge superlattices. The submicron spatial reso...
Raman spectroscopy and spectroscopic ellipsometry have been used to characterize Si/Si-0.78 Ge-0.22 ...
Second-harmonic (SH) generation has been applied to study the interfaces of short-period (GenSim)(p)...
The phonon spectra of Si/Ge superlattices are calculated along the growth direction. Besides folded ...
We report on growth and properties of Si/SiGe strained layer superlattices. Critical thicknesses and...