Reflective Infrared Ellipsometry Of Plastic Films

High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 μm thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results. © Springer Science+Business Media, LLC 2006