Add to ORKGWe developed a tool for the reliability analysis of SEU effects on the configuration memory of Xilinx Zynq SRAM-based FPGAs. A proton radiation test campaign on different TMR layouts demonstrated the effectiveness of our approach
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Soft errors induced by radiation are the major reliability threat for SRAM-based field-programmable ...
There are many platforms and tools based on field-programmable gate array (FPGA) devices oriented to...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
International audienceThis paper presents experimental results putting in evidence the potential wea...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
SRAM-Based FPGAs represent a low-cost alternative to ASIC device thanks to their high performance an...
During the Summer Student program in CERN I was working in the CMS Muon Drift Tube group, building a...
\u3cp\u3eRecently, SRAM-based FPGAs are widely used in aeronautic and space systems. As the adverse ...
ISBN 978-1-4244-8156-9International audienceAn increasing number of applications rely on embedded sy...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
Field programmable gate arrays (FPGAs) use memory cells, primarily static random-access memory (SRAM...
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-criti...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Soft errors induced by radiation are the major reliability threat for SRAM-based field-programmable ...
There are many platforms and tools based on field-programmable gate array (FPGA) devices oriented to...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
International audienceThis paper presents experimental results putting in evidence the potential wea...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
SRAM-Based FPGAs represent a low-cost alternative to ASIC device thanks to their high performance an...
During the Summer Student program in CERN I was working in the CMS Muon Drift Tube group, building a...
\u3cp\u3eRecently, SRAM-based FPGAs are widely used in aeronautic and space systems. As the adverse ...
ISBN 978-1-4244-8156-9International audienceAn increasing number of applications rely on embedded sy...
Predicting soft errors on SRAM-based FPGAs without a wasteful time-consuming or a high-cost has alwa...
Field programmable gate arrays (FPGAs) use memory cells, primarily static random-access memory (SRAM...
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-criti...
Various formal approaches can be used to study FPGA-based systems in relationships to faults, in par...
SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...