Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation

In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic-inorganic interface. The C ls core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule-substrate interaction. XAS at the Cu L-3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40 Angstrom CuPc film the molecular plane was found to be almost perpendicular to the substrate surface. (C) 2004 Elsevier B.V. All rights reserved