The VUV and soft x-ray free electron laser FLASH (former VUV-FEL) is a user facility at DESY (Hamburg). In order to optimize the performance of the facility, an accurate characterization of the electron beam properties is essential. The transverse projected emittance, one of the important parameters characterizing the quality of an electron beam, is measured using a four monitor method with optical transition radiation monitors. A normalized rms emittance below 2 mmmrad for a 1 nC beam has been measured. In this paper we describe the experimental setup, data analysis methods, and present experimental results.

The VUV and soft x-ray free electron laser FLASH (former VUV-FEL) is a user facility at DESY (Hamburg). In order to optimize the performance of the facility, an accurate characterization of the electron beam properties is essential. The transverse projected emittance, one of the important parameters characterizing the quality of an electron beam, is measured using a four monitor method with optical transition radiation monitors. A normalized rms emittance below 2 mmmrad for a 1 nC beam has been measured. In this paper we describe the experimental setup, data analysis methods, and present experimental results