Conversion of Filtek Silorane Adhesive determined by Raman spectroscopy.

This study examined the adhesive interface created by Filtek Silorane Adhesive System (SIL, 3M ESPE, USA) using micro-Raman spectroscopy. The HL thickness of the adhesive interface created by SIL was comparable with data previously reported on self-etch adhesives, while the adhesive layer was considerably thicker. As previous investigations revealed that high DC is a fundamental pre-requisite for the stability of the resin bond over time, the DC results of the present study support the hypothesis that optimal stability of SIL within the HL can be obtained. However, further studies are needed to investigate the mechanical properties of the hybrid layer created by SIL and its stability over time