This paper describes one of the first studies of the degradation of retrofit light bulbs based on white GaN light emitting diodes. The results indicate that the lifetime of LED lamps depends mostly on the stability of the driver and optical elements, rather than on the degradation of the LED chips, that have a stable output over stress time. By comparing lamps from four different manufacturers stressed at room and high temperature, we found that (i) long-term stress causes a change of the chromatic properties of the lamps, which is ascribed to the degradation of the phosphors or to the inner LED reflector; (ii) during aging the LED driver may degrade gradually and/or catastrophically, causing a reduction of the output optical power, or a co...
This paper reports an extensive analysis of the degradation of Phosphor-Converted Light-Emitting Dio...
With this paper we present an analysis of the degradation of state-of-the-art high power LEDs. Three...
With this work we review the failure modes and mechanisms of GaN-based optoelectronic devices. A num...
This paper reports the results of a reliability investigation performed on four different groups of ...
With this paper we give an overview on the degradation mechanisms that limit the reliability of whit...
We review the failure modes and mechanisms of gallium nitride (GaN)-based light-emitting diodes (LED...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
We review the degradation mechanisms that limit the reliability of GaN-based light-emitting diodes (...
This paper presents a study of the degradation mechanisms that limit the reliability of commercially...
Over the last years, GaN-based light-emitting diodes (LEDs) have been shown to be excellent candidat...
National Natural Science Foundation of China [60476022]; National High Technology Research and Devel...
In this paper we report the analysis of thermal stability of High Brightness Light Emitting Diode su...
This paper describes an extensive analysis of the degradation of high-power white LEDs, submitted to...
This paper reports a study of the degradation mechanisms that limit the reliability of GaN-based LED...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
This paper reports an extensive analysis of the degradation of Phosphor-Converted Light-Emitting Dio...
With this paper we present an analysis of the degradation of state-of-the-art high power LEDs. Three...
With this work we review the failure modes and mechanisms of GaN-based optoelectronic devices. A num...
This paper reports the results of a reliability investigation performed on four different groups of ...
With this paper we give an overview on the degradation mechanisms that limit the reliability of whit...
We review the failure modes and mechanisms of gallium nitride (GaN)-based light-emitting diodes (LED...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
We review the degradation mechanisms that limit the reliability of GaN-based light-emitting diodes (...
This paper presents a study of the degradation mechanisms that limit the reliability of commercially...
Over the last years, GaN-based light-emitting diodes (LEDs) have been shown to be excellent candidat...
National Natural Science Foundation of China [60476022]; National High Technology Research and Devel...
In this paper we report the analysis of thermal stability of High Brightness Light Emitting Diode su...
This paper describes an extensive analysis of the degradation of high-power white LEDs, submitted to...
This paper reports a study of the degradation mechanisms that limit the reliability of GaN-based LED...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
This paper reports an extensive analysis of the degradation of Phosphor-Converted Light-Emitting Dio...
With this paper we present an analysis of the degradation of state-of-the-art high power LEDs. Three...
With this work we review the failure modes and mechanisms of GaN-based optoelectronic devices. A num...