The work presented in this thesis describes a prototype version of a double-ended interferometer built at Physikalisch-Technische Bundesanstalt (PTB) for measuring the length of short as well as long gauge blocks. In this setup, more than one wavelength is used which makes this interferometer much more effective for accurate extraction of the integer orders of interference. A special design for the light source is found to allow the same adjustment states at the different wavelengths. The PTB double-ended interferometer prototype shows consistent results for the two wavelengths used and a good agreement with well-established PTB gauge block interferometers (INKO5 and Köster). The current uncertainty of the double-ended interferometer prot...
An instrument for step-height measurement by multiple-wavelength interferometry is described. The ad...
3 f. :il.performed at INMETRO, and the results of the CIPM Key Comparison CCL-2 show that the uncert...
Gauge blocks continue to be essential reference artifacts in manufacturing because of their simple g...
Es wird ein Verfahren vorgestellt, mit dem sich Parallelendmaße vollautomatisch kalibrieren lassen. ...
This paper shows the result of work of the Institute of Micromechanics and Photonics at Warsaw Unive...
This thesis describes the design, construction and testing of a new interferometer for the absolute ...
Double-ended interferometry has several benefits over single-ended gauge block interferometry: there...
Automated interferometer equipments are described which can be used for calibration of gauge blocks ...
At NMISA the SI unit for length is realised by an iodine stabilised He-Ne laser, an optica...
This paper presents a contactless system for automatic gauge blocks calibration based on combination...
AbstractWhen gauge blocks are calibrated by the laser interferometer technique, phase-change correct...
An interferometer is realized, based on the Twyman-Green Interferometer principle for the calibratio...
The concept of an absolute ranging interferometer based on a multiwavelength technique was devised a...
This paper presents the evaluation of the uncertainty for the length measurement of gauge blocks by ...
Stosowany od lat w Laboratorium Długości Zakładu Długości i Kąta GUM, komparator interferencyjny do ...
An instrument for step-height measurement by multiple-wavelength interferometry is described. The ad...
3 f. :il.performed at INMETRO, and the results of the CIPM Key Comparison CCL-2 show that the uncert...
Gauge blocks continue to be essential reference artifacts in manufacturing because of their simple g...
Es wird ein Verfahren vorgestellt, mit dem sich Parallelendmaße vollautomatisch kalibrieren lassen. ...
This paper shows the result of work of the Institute of Micromechanics and Photonics at Warsaw Unive...
This thesis describes the design, construction and testing of a new interferometer for the absolute ...
Double-ended interferometry has several benefits over single-ended gauge block interferometry: there...
Automated interferometer equipments are described which can be used for calibration of gauge blocks ...
At NMISA the SI unit for length is realised by an iodine stabilised He-Ne laser, an optica...
This paper presents a contactless system for automatic gauge blocks calibration based on combination...
AbstractWhen gauge blocks are calibrated by the laser interferometer technique, phase-change correct...
An interferometer is realized, based on the Twyman-Green Interferometer principle for the calibratio...
The concept of an absolute ranging interferometer based on a multiwavelength technique was devised a...
This paper presents the evaluation of the uncertainty for the length measurement of gauge blocks by ...
Stosowany od lat w Laboratorium Długości Zakładu Długości i Kąta GUM, komparator interferencyjny do ...
An instrument for step-height measurement by multiple-wavelength interferometry is described. The ad...
3 f. :il.performed at INMETRO, and the results of the CIPM Key Comparison CCL-2 show that the uncert...
Gauge blocks continue to be essential reference artifacts in manufacturing because of their simple g...