Signature analysis is a well established technique in digital system maintenance. The paper illustrates how a signature analyser can be employed for functional testing of microprocessor systems in a production environment, by suitably organizing the test procedure. The proposed functional test method features easy set-up, effective diagnostic capabilities on faulty systems, and reduced requirements for test documentation. Examples taken from a real life case are discussed to point out peculiar aspects of the method
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
A large part of microprocessor cores in use today are de- signed to be cheap and mass produced. The ...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
The purpose of the work: the development of method of the signature analysis. Offered has been the m...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Thesis (M.E.Sc.) -- University of Adelaide, Dept. of Electrical Engineering, 198
The gate-level testing also called low-level testing is generally appropriate at the design time and...
In this paper, we focus on the use of signature-based output compaction technique for built-in self-...
ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed....
Published in: 2017 13th International Computer Engineering Conference (ICENCO) Date of Conference: ...
The growing usage of electronic systems in safety- and mission-critical applications, together wi...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
Microprocessor technology is increasingly used for many applications; the large market volumes call ...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
A large part of microprocessor cores in use today are de- signed to be cheap and mass produced. The ...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
A test system is considered in which the signature analyzer, i.e. the most frequently applied system...
The purpose of the work: the development of method of the signature analysis. Offered has been the m...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Thesis (M.E.Sc.) -- University of Adelaide, Dept. of Electrical Engineering, 198
The gate-level testing also called low-level testing is generally appropriate at the design time and...
In this paper, we focus on the use of signature-based output compaction technique for built-in self-...
ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed....
Published in: 2017 13th International Computer Engineering Conference (ICENCO) Date of Conference: ...
The growing usage of electronic systems in safety- and mission-critical applications, together wi...
Testing digital devices constitutes a major portion of the cost and effort involved in their design,...
Microprocessor technology is increasingly used for many applications; the large market volumes call ...
121 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1987.This thesis presents new appr...
A large part of microprocessor cores in use today are de- signed to be cheap and mass produced. The ...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...