The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducting tensile tests with in situ X-ray micro-computed tomography (mu-CT) observation, and finite element (FE) simulation. The tensile fracture process of solder joints with a real internal defect structure was simulated and compared with the experimental results in terms of defect distribution and fracture path. Additionally, the stress distribution around the defects during the tensile process was calculated. The experimental results reveal that the pores near the intermetallic compound (IMC) layers and the flaky cracks inside the solder significantly affected the crack path. The aggregation degree of the spherical pores and the angle between t...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
Technology advancement in the electronic and electrical industry has been a crucial factor in the de...
Technology advancement in the electronic and electrical industry has been a crucial factor in the de...
A numerical study was undertaken to investigate the solder joint failure under fast loading conditio...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
Tensile testing was carried out at constant cross-head speed of 0.5 mm/min on specimens of two Cu bl...
Technology advancement in the electronic and electrical industry has been a crucial factor in the de...
Technology advancement in the electronic and electrical industry has been a crucial factor in the de...
A numerical study was undertaken to investigate the solder joint failure under fast loading conditio...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
Lead-free solder balls with a composition 95.5Sn-4.0Ag-0.5Cu (SAC) are examined both microstructural...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...