This work presents the results of an extensive DC current aging and failure analysis carried out on blue InGaN/GaN LEDs which identify failure mechanisms related to package degradation, changes in effective doping profile, and generation of deep levels. DLTS and ElectroLuminescence (EL) spectra indicate the creation of extended defects in devices aged at very high current density
We review the failure modes and mechanisms of gallium nitride (GaN)-based light-emitting diodes (LED...
We review the degradation mechanisms that limit the reliability of GaN-based light-emitting diodes (...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
High-brightness, high-efficiency GaN-based LEDs have already found many applications, and are extrem...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
In this work we report on a reliability study carried out over InGaN/GaN LEDs. Accelerated life test...
In this work we report on a reliability study carried out over InGaN/GaN LEDs. Accelerated life test...
We report the results of a reliability evaluation plan carried out on GaN/InGaN blue LEDs, including...
This work describes an experiment on degradation mechanisms of InGaN light-emitting diode (LED) tes...
Herein, the main factors and mechanisms that limit the reliability of gallium nitride (GaN)-based li...
Herein, the main factors and mechanisms that limit the reliability of gallium nitride (GaN)-based li...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
With this paper we give an overview on the physical mechanisms responsible for the optical degradati...
We review the failure modes and mechanisms of gallium nitride (GaN)-based light-emitting diodes (LED...
We review the degradation mechanisms that limit the reliability of GaN-based light-emitting diodes (...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
This work presents the results of an extensive DC current aging and failure analysis carried out on ...
High-brightness, high-efficiency GaN-based LEDs have already found many applications, and are extrem...
This paper presents failure modes observed in long-term aging of high-brightness GaN/InGaN LEDs. The...
In this work we report on a reliability study carried out over InGaN/GaN LEDs. Accelerated life test...
In this work we report on a reliability study carried out over InGaN/GaN LEDs. Accelerated life test...
We report the results of a reliability evaluation plan carried out on GaN/InGaN blue LEDs, including...
This work describes an experiment on degradation mechanisms of InGaN light-emitting diode (LED) tes...
Herein, the main factors and mechanisms that limit the reliability of gallium nitride (GaN)-based li...
Herein, the main factors and mechanisms that limit the reliability of gallium nitride (GaN)-based li...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
With this paper we give an overview on the physical mechanisms responsible for the optical degradati...
We review the failure modes and mechanisms of gallium nitride (GaN)-based light-emitting diodes (LED...
We review the degradation mechanisms that limit the reliability of GaN-based light-emitting diodes (...
With this paper we give an overview on the physical mechanisms that limit the reliability of GaN-bas...
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