With deep submicron scaling, soft error has become one of the major reliability challenges for electronic systems. This work proposes a Machine Learning-based Checker (MLC) to protect hard-core processors against radiation-induced soft errors. MLC is an independent hardware unit that implements an ML algorithm to detect soft errors in a processor and works in a parallel fashion with that. This work considers XGBoost as a lightweight and high-performance machine learning method. XGBoost is trained based on some programmers’ view features of the processor like control signals. The proposed scheme is applied to a RISC-V-like processor, called SAYAC, as a case study
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
International audienceMachine learning (ML) algorithms have been regaining momentum thanks to their ...
Radiation-induced soft errors are one of the most challenging issues in Safety Critical Real-Time Em...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
As transistor density continues to increase with the advent of nanotechnology, reliability issues ra...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
ISBN 1402075286A software technique allowing soft errors detection occurring in processor-based digi...
Machine learning (ML) based inference has recently gained importance as a key kernel in processing m...
International audienceThis paper compares and assesses the effectiveness of three prominent machine ...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
The soft error phenomenon is forecast to be a real threat for today’s technology of ICs. While imple...
International audienceTo achieve a substantial reliability and safety level, it is imperative to pro...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...
International audienceMachine learning (ML) algorithms have been regaining momentum thanks to their ...
Radiation-induced soft errors are one of the most challenging issues in Safety Critical Real-Time Em...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
As transistor density continues to increase with the advent of nanotechnology, reliability issues ra...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
ISBN 1402075286A software technique allowing soft errors detection occurring in processor-based digi...
Machine learning (ML) based inference has recently gained importance as a key kernel in processing m...
International audienceThis paper compares and assesses the effectiveness of three prominent machine ...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
The soft error phenomenon is forecast to be a real threat for today’s technology of ICs. While imple...
International audienceTo achieve a substantial reliability and safety level, it is imperative to pro...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Hardware errors are on the rise with reducing chip sizes, and power constraints have necessitated th...