Manufacturers of CubeSats prefer the use of COTS electronic components such as microcontrollers (MCU) and SDRAM but these components are vulnerable to errors caused by radiation. A specific type of error caused by radiation are soft errors which can be corrected by Error Detection and Correction (EDAC) methods. Unfortunately, it is uncommon for MCUs to have an (optimal) EDAC solution integrated in their memory controller. In these cases an external solution is required. This work proposes a generic methodology towards transparent FPGA-based correction of soft errors that can be applied given a specific microcontroller and its off-chip main memory. To determine how powerful the EDAC solution must be the methodology uses reliability models to...
Error Detection and Correction (EDAC) functions have been widely used for protecting memories from s...
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vuln...
As transistor density continues to increase with the advent of nanotechnology, reliability issues ra...
Radiation is a well-known problem for satellites in space. It can produce different negative effects...
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using comme...
Memory Errors Detection and Correction aim to secure the transaction of data between the central pro...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
Functionality of electronic components in space is strongly influenced by the impact of radiation in...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
Radiation hardening for coping with cosmic-ray-induced faults in electronic equipment has always bee...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
International audienceIonizing radiation and electromagnetic interference (EMI) can cause single eve...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Error Detection and Correction (EDAC) functions have been widely used for protecting memories from s...
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vuln...
As transistor density continues to increase with the advent of nanotechnology, reliability issues ra...
Radiation is a well-known problem for satellites in space. It can produce different negative effects...
This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using comme...
Memory Errors Detection and Correction aim to secure the transaction of data between the central pro...
Radiation-induced Soft Errors are widely known since the advent of dynamic RAM chips. Reconfigurable...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
Functionality of electronic components in space is strongly influenced by the impact of radiation in...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Field-programmable gate arrays (FPGAs) are increasingly susceptible to radiation-induced single even...
Radiation hardening for coping with cosmic-ray-induced faults in electronic equipment has always bee...
The configuration memory of SRAM-based Field-Programmable Gate Arrays (FPGAs) is susceptible to radi...
International audienceIonizing radiation and electromagnetic interference (EMI) can cause single eve...
Due to technology scaling, which means reduced transistor size, higher density, lower voltage and mo...
Error Detection and Correction (EDAC) functions have been widely used for protecting memories from s...
Space processing applications deployed on SRAM-based Field Programmable Gate Arrays (FPGAs) are vuln...
As transistor density continues to increase with the advent of nanotechnology, reliability issues ra...