The effect of air/AlGaN and GaN/substrate polarization charges on the performances of GaN-based HEMTs have been investigated. We find that surface charges and, with a minor extend, GaN/substrate charges are responsible for the observed premature saturation of the dc output characteristics. Moreover, our work show that the polarization charges and holes trap appear as the source of the drain current collapse observed in GaN-based HEMTs
Results related to electrical instabilities in AlGaN/GaN HEMTs will be presented. We have observed a...
The root cause of "current collapse" associated with GaN HFET subjected to high power or p...
Studies on the characteristics of AlGaN/GaN high-electron-mobility transistor (HEMTs) were performed...
The effect of air/AlGaN and GaN/substrate polarization charges on the performances of GaN-based HEMT...
The effect of air/AlGaN and GaN/substrate polarization charges on the dc performances of GaN-based H...
In this work, we analyze for the first time, by means of 2D numerical device simulations, the influe...
In this work, we analyze for the first time, by means of 2D numerical device simulations, the influe...
Evidence of mobile, positive charges (holes) on the top surface of GaN HFET is found by conducting C...
RF current collapse is investigated in AlGaN/GaN HEMT's by means of pulsed, transient, and small-sig...
Current collapse (drain current dispersion, gradual power saturation, or memory effect) encountered ...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
Long-term on-state and off-state high-electric-field stress results are presented for unpassivated G...
The effect of donor-like surface traps on two-dimensional electron gas (2DEG) and drain current coll...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
Results related to electrical instabilities in AlGaN/GaN HEMTs will be presented. We have observed a...
The root cause of "current collapse" associated with GaN HFET subjected to high power or p...
Studies on the characteristics of AlGaN/GaN high-electron-mobility transistor (HEMTs) were performed...
The effect of air/AlGaN and GaN/substrate polarization charges on the performances of GaN-based HEMT...
The effect of air/AlGaN and GaN/substrate polarization charges on the dc performances of GaN-based H...
In this work, we analyze for the first time, by means of 2D numerical device simulations, the influe...
In this work, we analyze for the first time, by means of 2D numerical device simulations, the influe...
Evidence of mobile, positive charges (holes) on the top surface of GaN HFET is found by conducting C...
RF current collapse is investigated in AlGaN/GaN HEMT's by means of pulsed, transient, and small-sig...
Current collapse (drain current dispersion, gradual power saturation, or memory effect) encountered ...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
Long-term on-state and off-state high-electric-field stress results are presented for unpassivated G...
The effect of donor-like surface traps on two-dimensional electron gas (2DEG) and drain current coll...
The physical mechanisms underlying RF current collapse effects in AlGaN-GaN HEMTs are investigated b...
Results related to electrical instabilities in AlGaN/GaN HEMTs will be presented. We have observed a...
The root cause of "current collapse" associated with GaN HFET subjected to high power or p...
Studies on the characteristics of AlGaN/GaN high-electron-mobility transistor (HEMTs) were performed...