Network-on-Chip (NoC) architectures have emerged as a better replacement of the traditional bus-based communication in the many-core era. However, continuous technology scaling has made aging mechanisms such as Negative Bias Temperature Instability (NBTI) and electromigration primary concerns in NoC design. In this paper1, we propose a novel system-level aging model to model the effects of asymmetric aging in NoCs. We observe a critical need of a holistic aging analysis, which when combined with power-performance optimization, poses a multi-objective design challenge. To solve this problem, we propose a Mixed Integer Linear Programming (MILP)-based aging-aware routing algorithm that optimizes the various design constraints using a multi-obj...
Ever since the VLSI process technology crossed the sub-micron threshold, there is an increased inter...
In this dissertation, I explore energy and reliability in future NoC (Network-on-Chip) interconnecte...
In this paper, we show that Negative Bias Temperature Instability (NBTI) aging of sleep transistors ...
Network-on-Chip (NoC) architectures have emerged as a better replacement of the traditional bus-base...
Network-on-Chip (NoC) architectures have emerged as a better replacement of the traditional bus-base...
Continuous technology scaling has made aging mechanisms such as Negative Bias Temperature Instabilit...
Continuous technology scaling has made aging mechanisms, such as negative bias temperature instabili...
The emergence of power efficient heterogeneous NoCs presents an intriguing challenge in NoC reliabil...
This Thesis is brought to you for free and open access by the Graduate Studies a
One of the fundamental challenges to the performance gain in advanced semiconductor technologyis agi...
The trend towards massive parallel computing has necessitated the need for an On-Chip communication ...
As number of components on the semi-conductor industry is growing at a healthy rate, results in an i...
abstract: Negative bias temperature instability (NBTI) is a leading aging mechanism in modern digita...
With technology advancement to the nanoscale level, 3D stacking of Integrated Circuits (ICs) provide...
Mainstream electronic designs are realized by Systems-on-Chips (SoCs) that push the limits of integr...
Ever since the VLSI process technology crossed the sub-micron threshold, there is an increased inter...
In this dissertation, I explore energy and reliability in future NoC (Network-on-Chip) interconnecte...
In this paper, we show that Negative Bias Temperature Instability (NBTI) aging of sleep transistors ...
Network-on-Chip (NoC) architectures have emerged as a better replacement of the traditional bus-base...
Network-on-Chip (NoC) architectures have emerged as a better replacement of the traditional bus-base...
Continuous technology scaling has made aging mechanisms such as Negative Bias Temperature Instabilit...
Continuous technology scaling has made aging mechanisms, such as negative bias temperature instabili...
The emergence of power efficient heterogeneous NoCs presents an intriguing challenge in NoC reliabil...
This Thesis is brought to you for free and open access by the Graduate Studies a
One of the fundamental challenges to the performance gain in advanced semiconductor technologyis agi...
The trend towards massive parallel computing has necessitated the need for an On-Chip communication ...
As number of components on the semi-conductor industry is growing at a healthy rate, results in an i...
abstract: Negative bias temperature instability (NBTI) is a leading aging mechanism in modern digita...
With technology advancement to the nanoscale level, 3D stacking of Integrated Circuits (ICs) provide...
Mainstream electronic designs are realized by Systems-on-Chips (SoCs) that push the limits of integr...
Ever since the VLSI process technology crossed the sub-micron threshold, there is an increased inter...
In this dissertation, I explore energy and reliability in future NoC (Network-on-Chip) interconnecte...
In this paper, we show that Negative Bias Temperature Instability (NBTI) aging of sleep transistors ...