X-ray optics, desired for beamlines at free-electron-laser and diffraction-limited-storage-ring x-ray light sources, must have almost perfect surfaces, capable of delivering light to experiments without significant degradation of brightness and coherence. To accurately characterize such optics at an optical metrology lab, two basic types of surface slope profilometers are used: The long trace profilers (LTPs) and nanometer optical measuring (NOM) like angular deflectometers, based on electronic autocollimator (AC) ELCOMAT-3000. The inherent systematic errors of the instrument's optical sensors set the principle limit to their measuring performance. Where autocollimator of a NOM-like profiler may be calibrated at a unique dedicated facility,...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
The research and development work on the Advanced Light Source (ALS) upgrade to a diffraction limite...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
Development of X-ray optics for 3rd and 4th generation X-ray light sources with a level of surface s...
Deflectometric profilometers based on industrial electronic autocollimators (ACs), as the ELCOMAT-30...
We present experimental, analytical, and numerical methods developed for reconstruction (deconvoluti...
The use of autocollimator-based profilometers of the Nanometer Optical measuring Machine (NOM) desig...
We present experimental, analytical, and numerical methods developed for reconstruction (deconvoluti...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
The research and development work on the Advanced Light Source (ALS) upgrade to a diffraction limite...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
X ray optics, desired for beamlines at free electron laser and diffraction limited storage ring x ra...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLS...
Development of X-ray optics for 3rd and 4th generation X-ray light sources with a level of surface s...
Deflectometric profilometers based on industrial electronic autocollimators (ACs), as the ELCOMAT-30...
We present experimental, analytical, and numerical methods developed for reconstruction (deconvoluti...
The use of autocollimator-based profilometers of the Nanometer Optical measuring Machine (NOM) desig...
We present experimental, analytical, and numerical methods developed for reconstruction (deconvoluti...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
We investigate and compare the spatial lateral resolution, or more generally, the instrument s tra...
The research and development work on the Advanced Light Source (ALS) upgrade to a diffraction limite...