International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promising candidates to replace finFETs, discussing some of their key features and potential extension and/or alternative options to help preserve the power, performance, area, and cost (PPAC) logic roadmap for advanced sub-5nm technology nodes, being also attractive for cold computing. In addition, given the increased complexity and cost in back-end-of-line processing, to take full advantage of the scaling performance benefits at transistor level it has also become ever more pressing to address signal and power wiring bottlenecks. The concept of moving power delivery to the wafer’s backside has been gaining traction and we will thus also explore it...
As the era of classical planar metal-oxide-semiconductor field-effect transistors (MOSFETs) comes to...
Since Moore’s law driven scaling of planar MOSFETs faces formidable challenges in the nanometer regi...
International audienceFuture ICs are facing dramatic challenges in performance as well as static and...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Comput...
In this paper, the innovations in device design of the gate-all-around (GAA) nanosheet FET are revie...
Technology scaling predicted by Moore's law is gradually slowing down and new alternatives to silico...
The semiconductor industry has largely relied on Moore’s law, based on the observation that every ne...
International audienceThis paper presents recent progress on Gate-All-Around (GAA) stacked-NanoWire ...
International audienceThis paper presents recent progress on Gate-All-Around (GAA) stacked-NanoWire ...
International audienceGate-all-around Vertical Nanowire Field Effect Transistors (VNWFET) are emergi...
International audienceGate-all-around Vertical Nanowire Field Effect Transistors (VNWFET) are emergi...
International audienceFuture ICs are facing dramatic challenges in performance as well as static and...
As the era of classical planar metal-oxide-semiconductor field-effect transistors (MOSFETs) comes to...
Since Moore’s law driven scaling of planar MOSFETs faces formidable challenges in the nanometer regi...
International audienceFuture ICs are facing dramatic challenges in performance as well as static and...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
International audienceWe report on vertically stacked nanosheet (NS) FET devices as the most promisi...
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Comput...
In this paper, the innovations in device design of the gate-all-around (GAA) nanosheet FET are revie...
Technology scaling predicted by Moore's law is gradually slowing down and new alternatives to silico...
The semiconductor industry has largely relied on Moore’s law, based on the observation that every ne...
International audienceThis paper presents recent progress on Gate-All-Around (GAA) stacked-NanoWire ...
International audienceThis paper presents recent progress on Gate-All-Around (GAA) stacked-NanoWire ...
International audienceGate-all-around Vertical Nanowire Field Effect Transistors (VNWFET) are emergi...
International audienceGate-all-around Vertical Nanowire Field Effect Transistors (VNWFET) are emergi...
International audienceFuture ICs are facing dramatic challenges in performance as well as static and...
As the era of classical planar metal-oxide-semiconductor field-effect transistors (MOSFETs) comes to...
Since Moore’s law driven scaling of planar MOSFETs faces formidable challenges in the nanometer regi...
International audienceFuture ICs are facing dramatic challenges in performance as well as static and...