Spectroscopic analysis of plasma modified polymer surfaces

The surface properties of polymers are essential for various industrial applications. Spectroscopy techniques like Fourier-transform infrared spectroscopy (FTIR), secondary mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), and nuclear magnetic resonance spectroscopy (NMR) are the most prominent for plasma modified polyolefin surface analysis. This book chapter provides a brief introduction to the principles of these spectroscopy methods, their uniqueness, usability, and limitations. The application of FTIR, SIMS, XPS, and NMR to the study of the surface physical and chemical properties of plasma modified polyolefins are described. Particular emphasis is devoted to the challenges arising from the chemical structure of polyolefins and handling the analysis