Add to ORKGTime-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers
Summary: The principal overall aim of this project was to develop and validate time-of-flight second...
\u3cp\u3eIn the last few years static secondary ion mass spectrometry (SSIMS) has proved to be a ver...
Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicolo...
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful analytical technique with gr...
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary io...
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary io...
AbstractA novel operation mode for time of flight-secondary ion mass spectrometry (ToF-SIMS) is desc...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
High-density polyethylene (HDPE) and polypropylene (PP) films were analysed by time-of-flight second...
Time-of-.ight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a ...
The authors have developed a parallel imaging MS/MS capability for the PHI nanoTOF II time-of-flight...
In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed ...
Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manu...
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging is a surface analysis technique th...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Summary: The principal overall aim of this project was to develop and validate time-of-flight second...
\u3cp\u3eIn the last few years static secondary ion mass spectrometry (SSIMS) has proved to be a ver...
Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicolo...
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful analytical technique with gr...
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary io...
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary io...
AbstractA novel operation mode for time of flight-secondary ion mass spectrometry (ToF-SIMS) is desc...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
High-density polyethylene (HDPE) and polypropylene (PP) films were analysed by time-of-flight second...
Time-of-.ight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a ...
The authors have developed a parallel imaging MS/MS capability for the PHI nanoTOF II time-of-flight...
In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed ...
Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manu...
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging is a surface analysis technique th...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Summary: The principal overall aim of this project was to develop and validate time-of-flight second...
\u3cp\u3eIn the last few years static secondary ion mass spectrometry (SSIMS) has proved to be a ver...
Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicolo...