We present the first experimental demonstration of sub-10-nm diameter GaSb/InAs vertical nanowire (VNW) Esaki diodes. Our devices exhibit excellent current scaling behavior over nearly two decades of diameter. An average Esaki peak current density of 1 MA/cm2 is obtained, among the best when projecting from the state-of-The-Art at our nominal doping level. An average current density of 4 MA/cm2 is demonstrated at mathrm{V}-{ ext{ds}}=0.3 mathrm{V}, which is promising for future ultra-low power VNW tunnel FET applications based on this material system. NEGF quantum transport simulations are carried out. Inelastic tunneling due to phonon emission is found to suppress tunneling current in the positive Vds branch and to widen the Esaki peak in ...
We present experimental data for a vertical, 22-nm-diameter InAs/(In)GaAsSb nanowire Tunnel Field-Ef...
A new processing scheme for the fabrication of sub-100-nm-gate-length vertical nanowire transistors ...
Gated transport measurements are the backbone of electrical characterization of nanoscale electronic...
This work studies the diameter scaling behavior of broken-band GaSb/InAs vertical nanowire (VNW) Esa...
We present electrical characterization of broken gap GaSb-InAsSb nanowire heterojunctions. Esaki dio...
Steep-slope devices, such as tunnel field-effect transistors (TFETs), have recently gained interest ...
We demonstrate improved performance due to enhanced electrostatic control achieved by diameter scali...
In this thesis fabrication and optimization of vertical III-V Tunneling Field-Effect transistors was...
We present a vertical nanowire InAs/GaAsSb/GaSb TFET with a highly scaled InAs diameter (20 nm). The...
We present electrical characterization of GaSb/InAs(Sb) nanowire tunnel field-effect transistors. The...
We present experimental data for a vertical, 22-nm-diameter InAs/(In)GaAsSb nanowire Tunnel Field-Ef...
We present vertical InAs/InGaAsSb/GaSb nanowire tunnel FETs (TFETs) on Si demonstrating subthreshold...
The ever-growing demand on high-performance electronics has generated transistors with very impressi...
Tunneling Field-Effect Transistors (TFET) are one of the most promising candidates for future low-po...
Tunneling Field-Effect Transistors (TFET) are one of the most promising candidates for future low-po...
We present experimental data for a vertical, 22-nm-diameter InAs/(In)GaAsSb nanowire Tunnel Field-Ef...
A new processing scheme for the fabrication of sub-100-nm-gate-length vertical nanowire transistors ...
Gated transport measurements are the backbone of electrical characterization of nanoscale electronic...
This work studies the diameter scaling behavior of broken-band GaSb/InAs vertical nanowire (VNW) Esa...
We present electrical characterization of broken gap GaSb-InAsSb nanowire heterojunctions. Esaki dio...
Steep-slope devices, such as tunnel field-effect transistors (TFETs), have recently gained interest ...
We demonstrate improved performance due to enhanced electrostatic control achieved by diameter scali...
In this thesis fabrication and optimization of vertical III-V Tunneling Field-Effect transistors was...
We present a vertical nanowire InAs/GaAsSb/GaSb TFET with a highly scaled InAs diameter (20 nm). The...
We present electrical characterization of GaSb/InAs(Sb) nanowire tunnel field-effect transistors. The...
We present experimental data for a vertical, 22-nm-diameter InAs/(In)GaAsSb nanowire Tunnel Field-Ef...
We present vertical InAs/InGaAsSb/GaSb nanowire tunnel FETs (TFETs) on Si demonstrating subthreshold...
The ever-growing demand on high-performance electronics has generated transistors with very impressi...
Tunneling Field-Effect Transistors (TFET) are one of the most promising candidates for future low-po...
Tunneling Field-Effect Transistors (TFET) are one of the most promising candidates for future low-po...
We present experimental data for a vertical, 22-nm-diameter InAs/(In)GaAsSb nanowire Tunnel Field-Ef...
A new processing scheme for the fabrication of sub-100-nm-gate-length vertical nanowire transistors ...
Gated transport measurements are the backbone of electrical characterization of nanoscale electronic...