A method and a relative test structure for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. This approach addresses the problem of short-circuit currents that affect known test structures, and allows a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segme...
Dielectric sensing based on capacitive measurement technology is a favourable measurement approach i...
A coupled interconnect model is developed using even mode and odd mode capacitance analysis. Signal ...
This paper investigates and measures the near end and far end crosstalk in the multiconductor transm...
A method and a relative test structure for measuring the coupling capacitance between two interconne...
Abstract: Charge-based capacitance measurements (CBCMs) are widely used to estimate on-chip wiring c...
Crosstalk within cable bundles can degrade system performance. In systems that use shielded twisted-...
Geometry scaling increases the relative effect of coupling capacitances on performance, power, and n...
The demand for computer simulation of multiconductor interconnections in VLSI structures necessitate...
Interconnection parasitic capacitance is the dominant delay and noise source in modem integrated cir...
Interconnection parasitic capacitance is the dominant delay and noise source in modern integrated ci...
We present a simple test structure (derived from the CBCM technique proposed by Sylvester et al.) th...
Interconnect parasitic parameters are the dominant source for delay and noise in modern integrated c...
♦ Cross coupling can occur via common return impedance, mutual inductance, and mutual capacitance LW...
Crosstalk within cable bundles can degrade system performance. In aircraft systems that use shielded...
International audienceConstant evolution in integrated circuit technology has led to an increase in ...
Dielectric sensing based on capacitive measurement technology is a favourable measurement approach i...
A coupled interconnect model is developed using even mode and odd mode capacitance analysis. Signal ...
This paper investigates and measures the near end and far end crosstalk in the multiconductor transm...
A method and a relative test structure for measuring the coupling capacitance between two interconne...
Abstract: Charge-based capacitance measurements (CBCMs) are widely used to estimate on-chip wiring c...
Crosstalk within cable bundles can degrade system performance. In systems that use shielded twisted-...
Geometry scaling increases the relative effect of coupling capacitances on performance, power, and n...
The demand for computer simulation of multiconductor interconnections in VLSI structures necessitate...
Interconnection parasitic capacitance is the dominant delay and noise source in modem integrated cir...
Interconnection parasitic capacitance is the dominant delay and noise source in modern integrated ci...
We present a simple test structure (derived from the CBCM technique proposed by Sylvester et al.) th...
Interconnect parasitic parameters are the dominant source for delay and noise in modern integrated c...
♦ Cross coupling can occur via common return impedance, mutual inductance, and mutual capacitance LW...
Crosstalk within cable bundles can degrade system performance. In aircraft systems that use shielded...
International audienceConstant evolution in integrated circuit technology has led to an increase in ...
Dielectric sensing based on capacitive measurement technology is a favourable measurement approach i...
A coupled interconnect model is developed using even mode and odd mode capacitance analysis. Signal ...
This paper investigates and measures the near end and far end crosstalk in the multiconductor transm...