Add to ORKGSingle Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increasingly important in combinational logic circuits. Combinational logic is resilient to soft errors due to three masking phenomena: (1) Logical Masking, (2) Electrical Masking, and (3) Latching-window Masking. This paper concentrates on logical masking, and proposes a probabilistic model which calculates the Soft Error Rate (SER) of any output node in combinational logic circuits, based on inherent logical masking properties
Abstract — Soft errors are functional failures resulting from the latching of single-event transient...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
ISBN 978-1-4419-6992-7; e-ISBN 978-1-4419-6993-4In nanometric technologies, circuits are increasingl...
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiati...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
A radiation strike on semiconductor device may lead to charge collection, which may manifest as a wr...
In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. S...
Abstract — Soft errors are functional failures resulting from the latching of single-event transient...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increas...
International audienceTechnology scaling in modern electronic circuits shrinks the transistor size a...
We develop a simple model that computes the probability that a strike at the output of a gate has an...
Integrated circuits are getting increasingly vulnerable to soft errors; as a consequence, soft error...
Abstract — Accurate electrical masking modeling represents a significant challenge in soft error rat...
ISBN 978-1-4419-6992-7; e-ISBN 978-1-4419-6993-4In nanometric technologies, circuits are increasingl...
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiati...
Reliability of VLSI circuits had always been a major issue during the design process. It becomes mor...
In recent years, soft errors happen in the combinational logic circuits that genuinely impact the ac...
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital syste...
A radiation strike on semiconductor device may lead to charge collection, which may manifest as a wr...
In nanometric technologies, circuits are increasingly sensitive to various kinds of perturbations. S...
Abstract — Soft errors are functional failures resulting from the latching of single-event transient...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...