The T center in silicon is a well-known carbon-based color center that has been recently considered for quantum technology applications. Using first-principles computations, we show that the excited state is formed by a defect-bound exciton made of a localized defect state occupied by an electron to which a hole is bound. The localized state is of strong carbon p character and reminiscent of the localization of the unpaired electron in the ethyl radical molecule. The radiative lifetime for the defect-bound exciton is calculated to be on the order of microseconds, much longer than for other quantum defects such as the nitrogen vacancy center in diamond and in agreement with experiments. The longer lifetime is associated with the small transi...
Excited states of a single donor in bulk silicon have previously been studied extensively based on ...
International audienceAmong the common vacancy-related point defects in silicon, the E center is one...
Theoretical investigations into deep-level defects in crystalline silicon are presented in this thes...
The T center in silicon is a well-known carbon-based color center that has been recently considered ...
The study of defect centers in silicon has been recently reinvigorated by their potential applicatio...
International audienceControlling the quantum properties of individual fluorescent defects in silico...
While many defects in silicon provide long-lived spin qubits, it remains difficult to use them as th...
An A-center is an oxygen interstitial atom near a lattice vacancy and is one of the most common impu...
Near-infrared color centers in silicon are emerging candidates for on-chip integrated quantum emitte...
Abstract Fluorescent centres in silicon have recently attracted great interest, owing to their remar...
We identify the exact microscopic structure of the G photoluminescence center in silicon by firstpri...
Point defects in semiconductors have been and will continue to be relevant for applications. Shallow...
The size-dependent optical properties of silicon nanosheets (SiNSs) are investigated using the time-...
Engineering coherent systems is a central goal of quantum science. Color centers in diamond are a pr...
Over the past two decades, optically active deep-level point defects in semiconductors became leadin...
Excited states of a single donor in bulk silicon have previously been studied extensively based on ...
International audienceAmong the common vacancy-related point defects in silicon, the E center is one...
Theoretical investigations into deep-level defects in crystalline silicon are presented in this thes...
The T center in silicon is a well-known carbon-based color center that has been recently considered ...
The study of defect centers in silicon has been recently reinvigorated by their potential applicatio...
International audienceControlling the quantum properties of individual fluorescent defects in silico...
While many defects in silicon provide long-lived spin qubits, it remains difficult to use them as th...
An A-center is an oxygen interstitial atom near a lattice vacancy and is one of the most common impu...
Near-infrared color centers in silicon are emerging candidates for on-chip integrated quantum emitte...
Abstract Fluorescent centres in silicon have recently attracted great interest, owing to their remar...
We identify the exact microscopic structure of the G photoluminescence center in silicon by firstpri...
Point defects in semiconductors have been and will continue to be relevant for applications. Shallow...
The size-dependent optical properties of silicon nanosheets (SiNSs) are investigated using the time-...
Engineering coherent systems is a central goal of quantum science. Color centers in diamond are a pr...
Over the past two decades, optically active deep-level point defects in semiconductors became leadin...
Excited states of a single donor in bulk silicon have previously been studied extensively based on ...
International audienceAmong the common vacancy-related point defects in silicon, the E center is one...
Theoretical investigations into deep-level defects in crystalline silicon are presented in this thes...