High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (ne AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy

A highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and force-distance spectroscopy was described. A novel fiber interferometer with very low noise levels was employed to detect cantilever displacements. The subangstrom oscillation amplitudes allow the force-distance measurements which reveal very short range force interactions