International audienceThe elastic modulus of thin films can be directly determined by instrumented indentation when the indenter penetration does not exceed a fraction of the film thickness, depending on the mechanical properties of both film and substrate. When it is not possible, application of models for separating the contribution of the substrate is necessary. In this work, the robustness of several models is analyzed in the case of the elastic modulus determination of a porous aluminium oxide film produced by anodization of an aluminium alloy. Instrumented indentation tests employing a Berkovich indenter were performed at a nanometric scale, which allowed a direct determination of the film elastic modulus, whose value was found to be ...
Simple equations are proposed for determining elastic modulus and hardness properties of thin films ...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
The indentation modulus of thin films of porous organosilicate glass with a nominal porosity content...
International audienceThe elastic modulus of thin films can be directly determined by instrumented in...
We have attempted to apply the computer-based finite element analysis (FEA) method to accurately mea...
Great interests have been made over the last few years in the development of techniques to measure t...
In the present paper, the hardness and Young's modulus of film-substrate systems are determined by m...
This work deals with the indentation analysis of nanocolumnar thin films and the difficulties encoun...
Results from several series of experimental investigations are described, which, it is hoped, will i...
There are various methods to address the problem of determining the hardness of thin films when the ...
This study explores the difficulties encountered when using conventional nanoindentation techniques ...
International audienceThe determination of the elastic modulus of thin films by indentation at nano ...
The impact of pore structure of nanoporous films on the measured elastic modulus is demonstrated for...
Much research has been focused on the mechanical properties of porous materials such as films of sil...
One of the major topics in novel microelectronics are thin film materials - especially their mechani...
Simple equations are proposed for determining elastic modulus and hardness properties of thin films ...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
The indentation modulus of thin films of porous organosilicate glass with a nominal porosity content...
International audienceThe elastic modulus of thin films can be directly determined by instrumented in...
We have attempted to apply the computer-based finite element analysis (FEA) method to accurately mea...
Great interests have been made over the last few years in the development of techniques to measure t...
In the present paper, the hardness and Young's modulus of film-substrate systems are determined by m...
This work deals with the indentation analysis of nanocolumnar thin films and the difficulties encoun...
Results from several series of experimental investigations are described, which, it is hoped, will i...
There are various methods to address the problem of determining the hardness of thin films when the ...
This study explores the difficulties encountered when using conventional nanoindentation techniques ...
International audienceThe determination of the elastic modulus of thin films by indentation at nano ...
The impact of pore structure of nanoporous films on the measured elastic modulus is demonstrated for...
Much research has been focused on the mechanical properties of porous materials such as films of sil...
One of the major topics in novel microelectronics are thin film materials - especially their mechani...
Simple equations are proposed for determining elastic modulus and hardness properties of thin films ...
Nanoindentation techniques have been widely used to measure thin film mechanical properties. One of ...
The indentation modulus of thin films of porous organosilicate glass with a nominal porosity content...