Electrical Measurement of the Thermal Impedance of Bipolar Transistors
- El Rafei, Abdelkader
- Quéré, Raymond
- Sommet, Raphaël
Publication date
January 2010
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
International audienceIn this letter, we present a characterization method for the determination of the thermal impedance of heterostructure bipolar transistors. The thermal impedance was characterized using low-frequency S-parameter measurements. We will show that our method can be used to characterize the thermal impedance independent of the transistor size
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