International audienceWe propose here a non-linear GaN HEMT model for CAD including a trapping effects description consistent with both small-signal and large-signal operating modes. It takes into account the dynamics of the traps and then allows to accurately model the modulated large signal characteristics that are encountered in telecommunication and radar signals. This model is elaborated through low-frequency S-parameter measurements complementary to more classical pulsed-IV characterizations. A 8x75um AlInN/GaN HEMT model was designed and particularly validated in large-signal pulsed RF operation. It is also shown that thermal and trapping effects have opposite effects on the output conductance, thus opening the way for separate chara...
The large-signal RF power performance of an AlGaN/GaN High Electron Mobility Transistor (HEMT) is st...
We show results of a self-consistent large-signal electro-thermal GaN HEMT model that includes trap ...
The extraction of an accurate model for GaN HEMT devices is of fundamental importance for high-power...
International audienceWe propose here a non-linear GaN HEMT model for CAD including a trapping effec...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
This paper investigates the back-gating effects due to traps, and presents a new nonlinear trap mode...
A large-signal measurement setup with sinusoidal excitation is used for the characterization of low-...
A large-signal measurement setup with sinusoidal excitation is used for the characterization of low-...
This paper presents a novel empirical model for gallium nitride on silicon carbide high-electron mob...
This paper presents a novel empirical model for gallium nitride on silicon carbide high-electron mob...
International audienceThis paper presents a non-linear electro-thermal AlGaN/GaN model for CAD appli...
International audienceThis paper presents a non-linear electro-thermal AlGaN/GaN model for CAD appli...
none3noThis paper presents a novel empirical model for gallium nitride on silicon carbide high-elect...
The large-signal RF power performance of an AlGaN/GaN High Electron Mobility Transistor (HEMT) is st...
We show results of a self-consistent large-signal electro-thermal GaN HEMT model that includes trap ...
The extraction of an accurate model for GaN HEMT devices is of fundamental importance for high-power...
International audienceWe propose here a non-linear GaN HEMT model for CAD including a trapping effec...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
International audienceRF GaN power technologies are emerging for future equipment in the defence, sp...
This paper investigates the back-gating effects due to traps, and presents a new nonlinear trap mode...
A large-signal measurement setup with sinusoidal excitation is used for the characterization of low-...
A large-signal measurement setup with sinusoidal excitation is used for the characterization of low-...
This paper presents a novel empirical model for gallium nitride on silicon carbide high-electron mob...
This paper presents a novel empirical model for gallium nitride on silicon carbide high-electron mob...
International audienceThis paper presents a non-linear electro-thermal AlGaN/GaN model for CAD appli...
International audienceThis paper presents a non-linear electro-thermal AlGaN/GaN model for CAD appli...
none3noThis paper presents a novel empirical model for gallium nitride on silicon carbide high-elect...
The large-signal RF power performance of an AlGaN/GaN High Electron Mobility Transistor (HEMT) is st...
We show results of a self-consistent large-signal electro-thermal GaN HEMT model that includes trap ...
The extraction of an accurate model for GaN HEMT devices is of fundamental importance for high-power...