International audienceThe testability of electronic devices is of critical importance and it is often supported by IEEE standards. The presence of test structures, on the other hand, paves the way for malicious attackers to access the circuit and extract confidential knowledge such as secret keys or intellectual property. Removing the access to these structures after manufacturing test may prevent security breaches, but this solution is not definitive and excludes the possibility of advanced uses such as online debugging, diagnosis of designs and on-line updates or monitoring. For this reason, it is important to maintain the test infrastructure but to protect it against threats either external (e.g., attackers) or internal (e.g., hardware t...
The standard IEEE 1149.1 (Test Access Port and Boundary-Scan Architecture, also known as JTAG port) ...
Globalization of the semiconductor industry increases the vulnerability of integrated circuits. This...
International audienceThe testability of electronic devices is of critical importance and it is ofte...
International audienceThe testability of electronic devices is of critical importance and it is ofte...
International audienceThe complexity of modern Systems-on-Chips is steadily increasing, which poses ...
International audienceCurrent Design-for-Test solutions for scan-based testing such as IEEE 1687 off...
Abstract — Hardware implementation of cryptographic algorithms is subject to various attacks. It has...
Test infrastructures are crucial to the modern Integrated Circuits (ICs) industry. The necessity of ...
International audienceThe growth in complexity of Integrated Circuits (IC) is supported, amongst oth...
National audienceTest infrastructures are widely deployed in modern Systems-on-Chip (SoC). They allo...
International audienceStandard test infrastructures, such as IEEE Std. 1149.1 (JTAG), IEEE Std. 1500...
International audienceAs security remains a major concern in more and more application, security of ...
This article presents a secure mutual testing strategy for System-on-Chips (SoCs) that implement cry...
International audienceStructural testing is one important step in the production of integrated circu...
The IEEE Std 1687 (IJTAG) provides enhanced access to the on-chip test instruments, which are inclu...
The standard IEEE 1149.1 (Test Access Port and Boundary-Scan Architecture, also known as JTAG port) ...
Globalization of the semiconductor industry increases the vulnerability of integrated circuits. This...
International audienceThe testability of electronic devices is of critical importance and it is ofte...
International audienceThe testability of electronic devices is of critical importance and it is ofte...
International audienceThe complexity of modern Systems-on-Chips is steadily increasing, which poses ...
International audienceCurrent Design-for-Test solutions for scan-based testing such as IEEE 1687 off...
Abstract — Hardware implementation of cryptographic algorithms is subject to various attacks. It has...
Test infrastructures are crucial to the modern Integrated Circuits (ICs) industry. The necessity of ...
International audienceThe growth in complexity of Integrated Circuits (IC) is supported, amongst oth...
National audienceTest infrastructures are widely deployed in modern Systems-on-Chip (SoC). They allo...
International audienceStandard test infrastructures, such as IEEE Std. 1149.1 (JTAG), IEEE Std. 1500...
International audienceAs security remains a major concern in more and more application, security of ...
This article presents a secure mutual testing strategy for System-on-Chips (SoCs) that implement cry...
International audienceStructural testing is one important step in the production of integrated circu...
The IEEE Std 1687 (IJTAG) provides enhanced access to the on-chip test instruments, which are inclu...
The standard IEEE 1149.1 (Test Access Port and Boundary-Scan Architecture, also known as JTAG port) ...
Globalization of the semiconductor industry increases the vulnerability of integrated circuits. This...
International audienceThe testability of electronic devices is of critical importance and it is ofte...