The probability of faults occurring in the field increases with the evolution of the CMOS technologies. It becomes, therefore, increasingly important to analyze the potential consequences of such faults on the applications. Fault injection techniques have been used for years to validate the dependability level of circuits and systems, and approaches have been proposed to analyze very early in the design process the functional consequences of faults. These approaches are based on the high-level description of the circuit or system and classically use simulation. Recently, hardware emulation on FPGA-based systems has been proposed to accelerate the experiments; in that case, an important characteristic is the time to reconfigure the hardware,...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount o...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769519261The probability of faults, and especially transient faults, occurring in the field i...
ISBN 978-2-9517461-1-4International audienceThis paper reports on the comparison of three different ...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount o...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769519261The probability of faults, and especially transient faults, occurring in the field i...
ISBN 978-2-9517461-1-4International audienceThis paper reports on the comparison of three different ...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
Steadily decreasing transistor sizes and new multi beam laser attacks lead to an increasing amount o...