ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection in programmable systems are introduced. In FPGA-based systems an important characteristic is the time to reconfigure the hardware. With novel FPGA families (e.g. Virtex, AT6000) it is possible to reconfigure the hardware partially in run-time. Important time-savings can be achieved when taking advantage of this characteristic for fault injection as only a small part of the device must be reconfigured
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perfor...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN 978-2-9517461-1-4International audienceThis paper reports on the comparison of three different ...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
ISBN: 0769519261The probability of faults, and especially transient faults, occurring in the field i...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
This thesis focuses on the development and performance analysis of a Run Time Reconfigurable (RTR) s...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perfor...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN 978-2-9517461-1-4International audienceThis paper reports on the comparison of three different ...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
ISBN: 0769519261The probability of faults, and especially transient faults, occurring in the field i...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
This thesis focuses on the development and performance analysis of a Run Time Reconfigurable (RTR) s...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This paper presents a technique for rapidtransientfault injection, regarding the CPU time, to perfor...